@article {1236,
	title = {Comparison between the polarized Fourier-transform infrared spectra of aged porous silicon and amorphous silicon dioxide films on Si (100) surface},
	journal = {Journal of Molecular Structure},
	volume = {508},
	number = {1-3},
	year = {1999},
	note = {Wang, JP Zou, BS El-Sayed, MA},
	month = {Sep},
	pages = {87-96},
	abstract = {The s- and p-polarized Fourier transform infrared spectra were measured for an aged porous silicon (PS) film on Si (100) surface. The asymmetric stretching and symmetric stretching modes as well as the bending or rocking mode of the Si-O-Si group are studied. The deconvoluted spectra in Si-O-Si asymmetric stretching frequency region at different polarization directions show two pairs of vibrational modes, and can be assigned to the longitudinal-optic (LO) and transverse-optic (TO) pair of the corresponding vibrational modes. The smaller LO-TO pair splitting, the broader bandwidth, and the lower polarization ratio of the PS vibration bands as compared with those observed in an a-SiO2 film on Si wafer, suggest a less ordered SiO2 structure and a shorter range of coulombic interaction in PS. (C) 1999 Elsevier Science B.V. All rights reserved.},
	isbn = {0022-2860},
	doi = {10.1016/s0022-2860(99)00003-4},
	author = {Wang, Jianping and Zou, Bingsuo and El-Sayed, Mostafa A}
}
