<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Hesabi, Z. R.</style></author><author><style face="normal" font="default" size="100%">Allam, N. K.</style></author><author><style face="normal" font="default" size="100%">Dahmen, K.</style></author><author><style face="normal" font="default" size="100%">Garmestani, H.</style></author><author><style face="normal" font="default" size="100%">El-Sayed, Mostafa A</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Self-Standing Crystalline TiO(2) Nanotubes/CNTs Heterojunction Membrane: Synthesis and Characterization</style></title><secondary-title><style face="normal" font="default" size="100%">Acs Applied Materials &amp; Interfaces</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2011</style></year><pub-dates><date><style  face="normal" font="default" size="100%">Apr</style></date></pub-dates></dates><number><style face="normal" font="default" size="100%">4</style></number><volume><style face="normal" font="default" size="100%">3</style></volume><pages><style face="normal" font="default" size="100%">952-955</style></pages><isbn><style face="normal" font="default" size="100%">1944-8244</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">In the present study, we report for the first time synthesis of TiO(2) nanotubes/CNTs heterojunction membrane. Chemical vapor deposition (CVD) of CNTs at 650 degrees C in a mixture of H(2)/He atmosphere led to in situ detachment of the anodically fabricated TiO(2) nanotube layers from the Ti substrate underneath. Morphological and structural evolution of TiO(2) nanotubes after CNTs deposition were investigated by field- emission scanning electron microscopy (FESEM), glancing angle X-ray diffraction (GAXRD), and X-ray photoelectron spectroscopy (XPS) analyses.</style></abstract><accession-num><style face="normal" font="default" size="100%">WOS:000289762400006</style></accession-num><notes><style face="normal" font="default" size="100%">Hesabi, Zohreh R. Allam, Nageh K. Dahmen, Klaus Garmestani, Hamid El-Sayed, Mostafa A.</style></notes><electronic-resource-num><style face="normal" font="default" size="100%">10.1021/am200124p</style></electronic-resource-num></record></records></xml>